[1] W.-F. Chang and C.-W. Wu, "Totally self-checking checkers for m-out-of-n code with lower hardware complexity", in Proc. 4th VLSI Design/CAD Workshop, Nantou, Aug. 1993, pp. 226~230.
[2] W.-F. Chang and C.-W. Wu, "Design of efficient totally self-checking checkers for m-out-of-n code", in Proc. 2nd IEEE Asian Test Symp. (ATS), Beijing, Nov. 1993, pp. 281~286.
[3] W.-F. Chang and C.-W. Wu, "Is there a combinational TSC checker for 1/3 code?", in Proc. 5th VLSI Design/CAD Symp., Tainan, Aug. 1994, pp. 199~204.
[4] W.-F. Chang and C.-W. Wu, "Design of TSC Berger code checkers for (2r-1)-bit information", in Proc. 6th VLSI Design/CAD Symp., Chiayi, Aug. 1995, pp. 132~135.
[5] W.-F. Chang and C.-W. Wu, "A TSC Berger code checker for (2r-1)-bit information", in Proc. 2nd IEEE Int. On-Line Testing Workshop, Biarritz, July 1996, pp. 158~161.
[6] H.-C. Kao, M.-F. Tsai, S.-Y. Huang, C.-W. Wu, W.-F. Chang, and S.-K. Lu, "Efficient double fault diagnosis for CMOS logic circuits", in Proc. 12th VLSI Design/CAD Symp., Hsinchu, Aug. 2001.
[7] S.-K. Lu, J.-L. Chen, C.-W. Wu, W.-F. Chang, and S.-Y. Huang, "Combinational circuit fault diagnosis using logic emulation", in Proc. IEEE Int. Symp. on Circuits and Systems (ISCAS), Bangkok, May 2003, vol. V, pp. 549~552.
[8] Wen-Feng Chang, D. Das and Cheng-Wen Wu,” Totally Self-Checking Borden Code Checker Design using modulo Adders,”, VLSI/CAD Symposium, Taiwan, (Aug. 2007)
[10] W.F. Chang and C.W. Wu, "Low-Cost Modular Totally Self-Checking Checker Design of m-out-of-n Codes for large range of n," 第五屆電資科技應用與發展學術研討會, Chung-Li, (Dec. 2010)
您現在的位置：
